Different Methods of Estimation in Two Parameter Geometric Distribution with Randomly Censored Data |
International Journal of System Assurance Engineering and Management, (Springer) |
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0975-6809 , 0976-4348 |
2021-11-29 |
SCOPUS, UGC-CARE |
Goel N. and Krishna H. |
Co-Author |
https://doi.org/10.1007/s13198-021-01520-1 |
Estimation in Residual lifetime Lindley distribution with Type II censored data |
International Journal of System Assurance Engineering and Management, (Springer) |
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0975-6809 , 0976-4348 |
2021-08-30 |
SCOPUS, UGC-CARE |
Goel N. and Krishna H. |
Co-Author |
https://doi.org/10.1007/s13198-021-01274-w |
Statistical inference for two Lindley populations under balanced joint progressive type‑II censoring scheme |
Computational Statistics (Springer) |
Vol. 37, pages263–286 |
1613-9658, 0943-4062 |
2021-07-05 |
SCOPUS, SCIE, UGC-CARE |
Goel R. and Krishna H. |
Co-Author |
https://doi.org/10.1007/s00180-021-01122-2 |
Likelihood and Bayesian inference for k Lindley populations under joint type-II censoring scheme |
Communications in Statistics - Simulation and Computation (Taylor and Francis) |
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0361-0918, 1532-4141 |
2021-06-28 |
SCOPUS, SCIE, WOS, UGC-CARE |
Goel R. and Krishna H. |
Co-Author |
https://doi.org/10.1080/03610918.2021.1937648 |
Progressive type-II random censoring scheme with Lindley failure and censoring time distributions |
International Journal of Agricultural and Statistical Sciences |
Vol. 16(1), Pages 23-34 |
0973-1903 |
2020-06-01 |
SCOPUS, UGC-CARE |
Goel R. and Krishna H. |
Co-Author |
https://www.researchgate.net/publication/352848443_Progressive_Type-II_Random_Censoring_Scheme_with_Lindley_Failure_and_Censoring_Time_Distributions |
Inferences for two Lindley populations based on joint progressive type-II censored data |
Communications in Statistics - Simulation and Computation (Taylor and Francis) |
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0361-0918 |
2020-04-20 |
SCOPUS, SCI Expanded, Web of Science |
Krishna H. and Goel R. |
Main Author |
• https://doi.org/10.1080/03610918.2020.1751851 |
Jointly type-II censored Lindley distributions |
Communications in Statistics- Theory and Methods (Taylor and Francis) |
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1532-415X |
2020-03-30 |
SCOPUS, SCI Expanded, Web of Science |
Krishna H. and Goel R. |
Main Author |
• https://doi.org/10.1080/03610926.2020.1743316 |
Estimation of parameters and reliability characteristics in Lindley distribution using randomly censored data |
Statistics, Optimization & Information Computing |
Vol 8, pp. 80-97 |
0233-1888 |
2020-02-17 |
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Garg R., Dube M. and Krishna H. |
Co-Author |
https://doi.org/10.19139/soic-2310-5070-692 |
Tolerance Limits for Systems Reliability |
Microelectronics Reliability (Elsevier) |
Volume 33, Issue 5, Pages 667-669 |
0026-2714 |
1993-04-01 |
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Sharma K.K. and Krishna H. |
Corresponding Author |
https://doi.org/10.1016/0026-2714(93)90274-3 |
Reliability Bounds for Some Static System Models using Lifetime Data on Their Components |
Microelectronics Reliability (Elsevier) |
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0026-2714 |
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Main Author |
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On the Estimation of Sample Size and Censoring Time in Life-Testing Experiments. |
Microelectronics Reliability (Elsevier) |
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0026-2714 |
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Sharma K.K. and Krishna H. |
Main Author |
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Tolerance Limits for the Reliability of a k-out-of-m System |
Microelectronics Reliability (Elsevier) |
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0026-2714 |
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Sharma K.K. and Krishna H. |
Main Author |
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Bayesian Reliability Analysis of a k-out-of –m System and the Estimation of Sample Size and Censoring Time |
Reliability Engineering and Systems Safety (Elsevier) |
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Sharma K.K. and Krishna H. |
Main Author |
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Asymptotic Sampling Distribution of Inverse Coefficient of Variation and its Applications |
IEEE Transactions on Reliability |
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Sharma K.K. and Krishna H. |
Main Author |
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Bayes Estimates of Pointwise and Interval Availability with Type I Censored Samples |
Microelectronics Reliability (Elsevier) |
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0026-2714 |
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Krishna H. and Sharma K.K. |
Main Author |
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Non-Parametric Distribution of Reliability Function for Some Basic System Configurations |
Microelectronics Reliability (Elsevier) |
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0026-2714 |
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Sharma K.K. and Krishna H. |
Main Author |
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Inferences on Availability Ratio |
Microelectronics Reliability (Elsevier) |
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0026-2714 |
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Krishna H. and Sharma K.K. |
Main Author |
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Non–Parametric Inferences on System Availability with a Reference of k-out-of-m System |
Microelectronics Reliability (Elsevier) |
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0026-2714 |
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Sharma K.K. and Krishna H. |
Main Author |
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On the Uniformly Minimum Variance Unbiased Estimator of Availability with Type I Censored Data |
Microelectronics Reliability (Elsevier) |
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0026-2714 |
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Sharma K.K. and Krishna H. |
Main Author |
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Bayes Estimation of the Mixture of Hazard-Rate Model |
Reliability Engineering and System Safety (Elsevier) |
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Sharma K.K., Krishna H. and Singh B. |
Main Author |
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Classical and Bayes Estimation of Reliability Characteristics of some Basic System Configurations with Geometric Lifetimes of Components |
Jorn. of Indian Assoc. for Productivity, Quality and Reliability |
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Krishna H. and Jain N. |
Main Author |
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Bayes Estimation of Some System Configurations with Geometric Lifetimes of Components and Type I Censored Sample |
International Journal of Agricultural and Statistical Sciences |
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Krishna H. and Jain N. |
Main Author |
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Maximum Likelihood Estimation of Reliability Characteristics of Some System Configurations with Pareto Lifetimes of Components and Type II Censored Data |
International Journal of Agricultural and Statistical Sciences |
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Krishna H. and Sharma R |
Main Author |
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Discrete Maxwell Distribution |
InerStat |
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Krishna H. and Pundir P.S. |
Main Author |
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Estimation of Reliability Characteristics of General System Configurations |
International Journal of Quality & Reliability Management |
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Krishna H. and Sharma R. |
Main Author |
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Discrete Burr and Discrete Pareto Distributions |
Statistical Methodology (Elsevier) |
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Krishna H. and Pundir P.S. |
Main Author |
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Reliability Estimation in Maxwell Distribution with Type-II Censored Data |
International Journal of Quality & Reliability Management |
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Krishna H. and Malik M. |
Main Author |
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A Bivariate Geometric Distribution with Applications to Reliability |
Communications in Statistics- Theory and Methods (Taylor and Francis) |
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Krishna H. and Pundir P.S. |
Main Author |
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On Type-II Progressively Hybrid Censoring |
Journal of Modern Applied Statistical Methods (JMASM) |
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Kundu D., Joarder A. and Krishna H. |
Main Author |
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Estimation of Various Availability Functions with Progressively Type II Censored Data |
International Journal of Agricultural and Statistical Sciences |
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KrishnaH. and Choudhary H. |
Main Author |
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Maximum Likelihood and Bayes Estimation of Steady-State, Point-Wise and Interval Availability with Censored Sample Information |
Journal of Applied Statistical Science (Nova Science Publishers Inc.) |
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KrishnaH. and Sharma R. |
Main Author |
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Inferences on Weibull Parameters with Conventional Type-I Censoring |
Computational Statistics and Data Analysis (Elsevier) |
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JoarderA., Krishna H. and Kundu D. |
Main Author |
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Reliability Estimation in Generalized Gamma Distribution with Progressively Type II Censored Data |
International Journal of Agricultural and Statistical Sciences |
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Krishna H. and Kumar K. |
Main Author |
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Reliability Estimation in Lindley Distribution with Progressively Type II Right Censored Sample |
Mathematics and Computers in Simulation (Elsevier) |
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Krishna H. and Kumar K. |
Main Author |
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Reliability Estimation in Maxwell Distribution with Progressively Type-II Censored Data |
Journal of Statistical Computation and Simulation (Taylor & Francis) |
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Krishna H. and Malik M. |
Main Author |
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Reliability Estimation in Generalized Inverted Exponential Distribution with Progressively Type II Right Censored Sample |
Journal of Statistical Computation and Simulation (Taylor & Francis) |
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Krishna H. and Kumar K. |
Main Author |
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Discrete Gamma Lifetime Model and its Applications |
Research & Review: Journal of Statistics, Special Issue on Recent Statistical Methodologies and Applications |
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Pundir P.S. and Krishna H. |
Main Author |
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Estimation of P(Y < X) in Lindley Distribution using Progressively First Failure Censoring |
International Journal of System Assurance Engineering and Management (Springer) |
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Kumar K., Krishna H., Garg R. |
Main Author |
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Estimation in Maxwell Distribution with Randomly Censored Data |
Journal of Statistical Computation and Simulation (Taylor & Francis) |
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Krishna H., Vivekanand, Kumar K. |
Main Author |
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On Progressively First Failure Lindley Distribution |
Computational Statistic (Springer) |
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Dube M., Krishna H. and Garg R. |
Main Author |
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Generalized Inverted Exponential Distribution under Progressive First Failure Censoring |
Journal of Statistical Computation and Simulation (Taylor & Francis) |
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Dube M., Krishna H. and Garg R. |
Main Author |
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On Randomly Censored Generalized Inverted Exponential Distribution |
American Journal of Mathematical and Management Sciences (Taylor & Francis) |
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Garg R., Dube M., Kumar K. and Krishna H. |
Main Author |
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Nakagami Distribution as a Reliability Model under Progressive Censoring |
International Journal of System Assurance Engineering and Management (Springer) |
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Kumar K., Krishna H., Garg R. |
Main Author |
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Maximum Likelihood and Bayes Estimation in Randomly Censored Geometric Distribution |
Journal of Probability and Statistics |
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Krishna H. and Goel N. |
Main Author |
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Randomly censored geometric distribution under Koziol-Green model |
International Journal of Agricultural and Statistical Sciences |
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Krishna H. and Goel N. |
Main Author |
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Estimation of P(Y<X) for progressively first failure censored generalized inverted exponential distribution |
Journal of Statistical Computation and Simulation (Taylor & Francis) |
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Krishna H. and Dube M. and Garg R. |
Main Author |
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Estimation methods in clinical trials with randomly censored exponential healing times and Rayleigh dropout times |
Biostatistics and Biometrics Open Access Journal |
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Goel N. and Krishna H. |
Main Author |
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Classical and Bayesian inference in two parameter exponential distribution with randomly censored data |
Computational Statistic (Springer) |
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Krishna H. and Goel N. |
Main Author |
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Estimation of Stress Strength Reliability of Inverse Weibull Distribution under Progressive First Failure Censoring |
Austrian Journal of Statistics (Austrian Society for Statistics) |
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Krishna H., Dube M. and Garg R. |
Main Author |
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